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The electron microscope analyzer

QUANTAX EBSD

The performance of the coaxial TKD have incomparable

The best spatial resolution

Low probe current requirements

Bright spot

1.5
nano
The effective spatial resolution
Unique coaxial TKD - detector geometry configuration, provides the best sample to achieve unparalleled performance
2
nA
Test the maximum current required
Coaxial TKD can achieve low probe current test, and shall not affect the test data quality and speed of students
125000
Pps
Super fast acquisition FSE, BSE and STEM images
Unparalleled ARGUS imaging system can be implemented in a few seconds, high contrast and low noise imaging

Spatial resolution with unparalleled nanomaterials orientation distribution

QUANTAX EBSD system combined with the popular OPTIMUS TKD detector, is the best solution for the analysis of nanomaterials in SEM.Here's why:

  • To provide the best spatial resolution of 1.5 nm
  • In does not affect the speed and/or data quality of test cases to test current is low
  • In the model using the immersion lens only work under the high resolution SEM TKD solution
  • Automatic built-inARGUSImaging system
Contact us OPTIMUS 2

advantage

Why do I need to coaxial TKD?

Ge - Sb - Te (GST) thin film samples of dark field like pictures, we thank Aaron Stanford university meyer-lindenberg group to provide samples and image results
  • The optimal spatial resolution
  • SEM to get orientation distribution and phase distribution
  • For rapid test, at the same time does not affect the data quality/integrity
  • With incredible speed, through automatic signal optimization, with good contrast and resolution photographs of STEM
  • Can use low current analysis of beam sensitive materials.

application

What is your analysis of the challenge?

In the measurement area through ARGUSM imaging detector sampled atomic contrast image.From different gray levels can infer the existence of at least five different stages.

Mineralogy the senior phase identification of the sample

EBSD is a very powerful technology in earth science research can be used in the analysis of microstructure and equal.
To read more
The Overview of the selected microprocessor: micro - XRF map acquired with M4 TORNADO.

Microstructure characterisation of a microprocessor wire bonding with EBSD

Ball bonding is a type of wire bonding, commonly, informs the for electrical interconnections in semiconductor devices.
To read more
Use of the ARGUSM imaging detector phase contrast image shows at least four different phase.Please note that there is a lot of fine sediment at the phase boundaries.EBSD/EDS measurements and the results are shown in figure 2 and 5.

Nickel-based super alloy microstructure characterization of EBSD

Nickel-based super alloy with excellent mechanical strength, thermal creep deformation, fatigue resistance, corrosion resistance, or oxidation is known.
To read more

webinar

webinar

2020 webinar banner 3 d ebsd eds qube
ON - DEMAND SESSION - 55 MINUTES

The Latest developments in the advanced 3 d EBSD/EDS data processing with ESPRIT QUBE

3 d - EBSD/EDS is a destructive tomographic method consisting of repeated sectioning and subsequent EBSD and EDS analysis.
csm_Fischione_Webinar_Banner_d7c396cbc4
ON - DEMAND SESSION - 50 MINUTES

The Advanced Sample Preparation by Broad Ion Beam Milling for EBSD Analyses

This webinar provides sample preparation solutions for challenging materials using Fischione Instruments' Model 1061 SEM Mill, a broad ion beam (BIB) Mill, and corresponding high quality EBSD measurements acquired using bob电竞安全吗Bruker eFlash FS detector.
csm_2020_Banner_nanostructural_characterization_semiconductors_2225c1c066
ON - DEMAND SESSION - 46 MINUTES

Nanostructural characterization of semiconductors with SEM

This webinar will discuss the policy characterization of nanostructured semiconducting materials using SEM with EDS and TKD techinques.

News and events

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publications

Related products

High eFlash HD for details and high resolution mode.

EFlash HD

New eFlash HD native CCD resolution of the detector is close to 2 million pixels (1600 x 1200 pixels), with the most advanced camera optical element, can minimize distortion, provide Gao Qingju pool pattern design, according to Mr. Kikuchi patterns the fine details.
To read more
EFlash FS, realizes the high sensitivity and high throughput.

EFlash FS

New EBSD detector eFlash FS to achieve maximum sensitivity, allowed in does not affect the data quality of high-speed EBSD measurements, the deformation or lightweight materials even in challenging applications.
To read more
OPTIMUS - 2 - eFlash - HD - detector - head

OPTIMUS 2

Our new, augmented TKD solution builds on the unmatched performance of existing on - axis TKD through the addition of multiple new hardware options, accessories, and software features.
To read more
Espirit 2 screenshots

Software: ESPRIT series

ESPRIT 2 combines four analysis methods under a single user interface.Including used for SEM EDS and (S), TEM, WDS, miniature XRF and EBSD for SEM.
To read more
Espirit, Mr

ESPRIT QUBE software

ESPRIT QUBE is used in senior 3 d EBSD and EDS data post-processing and visualization analysis of modern software platform.It has the most advanced analysis software, can be used in the electron microscope EBSD and/or EDS to collect data for 3 d visualization and data post-processing.
To read more
FSE/BSE detectors mounted above and below the eFlash screen

Ultrafast ForeScatter Electron (FSE) and BackScatter Electron (BSE) Imaging of EBSD Samples

ARGUS imaging system combines an ingenious idea with ultra - high quality silicon diodes anbob电竞安全吗d Bruker's unrivalled signal processing technology to deliver FSE and BSE images with unmatched quality and detail.
To read more

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