In situ nano mechanical test

Compatible with TKD and STEM Hysitron PI 89

Provide electronic transparent samples analysis of imaging

Hysitron PI 89Now in the nano mechanics test at the same time, using the TKD and STEM of electron transparent samples analysis imaging detector.Transmission of kikuchi diffraction (TKD) has recently introduced a scanning electron microscope, electron back scattering diffraction has been established with the test results with electron backscattered diffraction (EBSD) technologies, it can increases the spatial resolution of sample 10 times.Through rapid install add-ons, modified Hysitron PI 89 system can create additional space at the bottom of the sample insert detector, so as to get the best signal.Brooke's patentsPressure switch moduleCan be used to TKD mode of tensile test, so as to provide samples with good stability.

Optimus TKD TKD detector and the high resolution image.

(or left) of the patents pressure switch module, can provide the most stable for TKD and STEM imaging sample configuration;(right) at the bottom of the insert sample TKD detector.

brookeOPTIMUS TKDDetector's unique design allows users to detector is placed directly in the sample below.In addition toE - Flash EBSDDetector, OPTIMUS can have the strongest signal, and to minimize the distortion caused by gnomonic projection.

Compatible with the instrument

Hysitron PI 89 nano indentation apparatus for SEM

Stability, precision and modular in situ SEM nano mechanical test equipment

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